Flux pinning in YBa2Cu3O7-δ thin film samples linked to stacking fault density

Applied Physics Letters

Volumn 92, Issue 8, 2008, Pages

  Wang, J ^a   Kwon, J H ^a   Yoon, J ^a   Wang, H ^a   Haugan, T J ^b   Baca, F J ^b   Pierce, N A ^b   Barnes, P N ^b  

^a Department of Electrical and Computer Engineering   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); FLUX PINNING; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MICROSTRUCTURE; STACKING FAULTS; YTTRIUM BARIUM COPPER OXIDES;

CROSS-SECTIONS; MICROSTRUCTURAL STUDIES; STACKING FAULT DENSITY;

THIN FILMS;

EID: 40049098842     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2888749     Document Type: Article

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