Stacking faults in YBa 2Cu 3O 7-x: Measurement using x-ray diffraction and effects on critical current

Applied Physics Letters

Volumn 89, Issue 16, 2006, Pages

  Specht, E D ^a   Goyal, A ^a   Li, J ^a   Martin, P M ^a   Li, X ^b   Rupich, M W ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b AMERICAN SUPERCONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH TEMPERATURE ANNEALING; METAL-ORGANIC DEPOSITION; TEXTURED TEMPLATES;

DEPOSITION; ELECTRIC CURRENTS; MAGNETIC FIELDS; TEXTURES; X RAY DIFFRACTION ANALYSIS; YTTRIUM COMPOUNDS;

STACKING FAULTS;

EID: 33750199744     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2364185     Document Type: Article

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