Microstructure of epitaxial Y123 films on CeO2-buffered YSZ prepared by fluorine-free MOD

IEEE Transactions on Applied Superconductivity

Volumn 17, Issue 2, 2007, Pages 3495-3498

  Yamaguchi, I ^a   Tsukada, K ^a   Kondo, W ^a   Sohma, M ^a   Kamiya, K ^a   Kumagai, T ^a   Manabe, T ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Critical current density; Metal organic deposition; Transmission electron microscopy; Y123 film

Indexed keywords

COATING TECHNIQUES; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); FULL WIDTH AT HALF MAXIMUM; SUPERCONDUCTING FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

HIGH RESOLUTION XTEM IMAGES; INDUCTIVE METHOD; METAL ORGANIC DEPOSITION; Y123 FILMS;

EPITAXIAL FILMS;

EID: 34547470044     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2007.900011     Document Type: Conference Paper

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