Thickness dependence of Jc for YBCO thin films prepared by large-area pulsed laser deposition on CeO2-buffered sapphire substrates

Superconductor Science and Technology

Volumn 18, Issue 5, 2005, Pages 667-674

  Develos Bagarinao, K ^a   Yamasaki, H ^a   Nie, J C ^b   Nakagawa, Y ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b BEIJING NORMAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CERIUM COMPOUNDS; DEFECTS; FILM GROWTH; MICROSTRUCTURE; POROSITY; PULSED LASER DEPOSITION; SAPPHIRE; SUBSTRATES; SURFACE ROUGHNESS; THICKNESS MEASUREMENT;

CERIUM CARBIDE; CERIUM OXIDE; FLUX PINNING; YBCO FILMS;

THIN FILMS;

EID: 24644465139     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/18/5/014     Document Type: Article

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