Surface concentration mapping of InAs/GaAs quantum dots

AIP Conference Proceedings

Volumn 893, Issue , 2007, Pages 49-50

  Biasiol, G ^a   Heun, S ^a   Golinelli, G B ^b   Locatelli, A ^c   Mentes, T O ^c   Guo, F Z ^d   Sorba, L ^a,b  

^a LABORATORIO TASC   (Italy)

^b UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^c SINCROTRONE TRIESTE   (Italy)

^d NONE   (Japan)

Author keywords

III V semiconductors; Photoelectron spectra; Segregation; Semiconductor quantum dots; Surface composition

Indexed keywords

EID: 77958484291     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2729764     Document Type: Conference Paper

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