메뉴 건너뛰기




Volumn 153, Issue 4-6, 1998, Pages 235-239

Locally excited surface-plasmon-polaritons for thickness measurement of LBK films

Author keywords

Langmuir Blodgett Kuhn film; Metallic film; Microscopic analysis; Surface plasmon; Thickness measurement

Indexed keywords

LANGMUIR BLODGETT FILMS; METALLIC FILMS; MICROSCOPIC EXAMINATION; THICKNESS MEASUREMENT; THIN FILMS;

EID: 0032141132     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(98)00240-5     Document Type: Article
Times cited : (62)

References (12)
  • 10
    • 0012337087 scopus 로고    scopus 로고
    • Guided wave optics for the characterization of polymeric thin films and interfaces
    • R.E. Hummel, P. Wissmann (Eds.), CRC, Boca Raton
    • W. Knoll, Guided wave optics for the characterization of polymeric thin films and interfaces, in: R.E. Hummel, P. Wissmann (Eds.), Handbook of Optical Properties, Vol. II, Optics of Small Particles Interfaces, and Surfaces, CRC, Boca Raton, 1997.
    • (1997) Handbook of Optical Properties, Vol. II, Optics of Small Particles Interfaces, and Surfaces , vol.2
    • Knoll, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.