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Volumn 153, Issue 4-6, 1998, Pages 235-239
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Locally excited surface-plasmon-polaritons for thickness measurement of LBK films
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Author keywords
Langmuir Blodgett Kuhn film; Metallic film; Microscopic analysis; Surface plasmon; Thickness measurement
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Indexed keywords
LANGMUIR BLODGETT FILMS;
METALLIC FILMS;
MICROSCOPIC EXAMINATION;
THICKNESS MEASUREMENT;
THIN FILMS;
SURFACE-PLASMON-POLARITONS (SPP);
QUANTUM OPTICS;
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EID: 0032141132
PISSN: 00304018
EISSN: None
Source Type: Journal
DOI: 10.1016/S0030-4018(98)00240-5 Document Type: Article |
Times cited : (62)
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References (12)
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