Empirical evaluation of NAND flash memory performance

Operating Systems Review (ACM)

Volumn 44, Issue 1, 2010, Pages 50-54

  Desnoyers, Peter ^a  

^a NORTHEASTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EMPIRICAL EVALUATIONS; FLASH CHIPS; LIFE SPAN; MEMORY SYSTEMS; MINIMUM VALUE; NAND FLASH; NAND FLASH MEMORY; ON CURRENTS; PERFORMANCE PENALTIES; PROGRAM/ERASE; STORAGE SUBSYSTEMS; SYSTEM LEVELS;

DURABILITY;

FLASH MEMORY;

EID: 77958118728     PISSN: 01635980     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1740390.1740402     Document Type: Article

References (14)

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