Role of the driving laser position on atomic force microscopy cantilevers excited by photothermal and radiation pressure effects

Applied Physics Letters

Volumn 97, Issue 14, 2010, Pages

  Vassalli, Massimo ^a   Pini, Valerio ^b   Tiribilli, Bruno ^a  

^a CNR   (Italy)

^b INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY CANTILEVERS; EXCITATION EFFICIENCY; FLEXURAL MODES; MICRO-CANTILEVERS; PHOTO-THERMAL; PHOTOTHERMAL EFFECTS; PHYSICAL PHENOMENA; RADIATION PRESSURE;

ATOMIC FORCE MICROSCOPY; LASER EXCITATION; NANOCANTILEVERS; RADIATION EFFECTS;

PRESSURE EFFECTS;

EID: 77958040223     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3497074     Document Type: Article

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