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Volumn 58, Issue 20, 2010, Pages 6592-6599

Microstructure evolution of Ti-Si-C-Ag nanocomposite coatings deposited by DC magnetron sputtering

Author keywords

Analytical electron microscopy; Eutectic solidification; Helium ion microscopy; Nanocomposite; X ray photoelectron spectroscopy

Indexed keywords

AG COMPOUNDS; ANALYTICAL ELECTRON MICROSCOPY; COATING THICKNESS; DC MAGNETRON SPUTTERING; EUTECTIC INTERACTIONS; EUTECTIC SOLIDIFICATION; HELIUM ION; HELIUM ION MICROSCOPY; HIGH RATE; MATRIX; MICROSTRUCTURE EVOLUTIONS; NANO-COMPOSITE COATING; SI CONTENT; TARGET COMPOSITION;

EID: 77958004988     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2010.08.018     Document Type: Article
Times cited : (32)

References (43)
  • 26
    • 0003689862 scopus 로고
    • T.B. Massalski, American Society for Metals Metals Park, Ohio
    • T.B. Massalski, Binary alloy phase diagrams 1986 American Society for Metals Metals Park, Ohio
    • (1986) Binary Alloy Phase Diagrams
  • 40
    • 0003659399 scopus 로고
    • J.M. Poate, K.N. Tu, J.W. Mayer, Wiley New York
    • J.M. Poate, K.N. Tu, J.W. Mayer, Thin films-interdiffusion and reactions 1978 Wiley New York 359 406
    • (1978) Thin Films-interdiffusion and Reactions , pp. 359-406


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.