Studies of phase formation and chemical states of the ion beam mixed Ag/Si(1 1 1) system

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 168, Issue 2, 2000, Pages 215-220

  Sarkar, D K ^a   Dhara, S ^b   Nair, K G M ^b   Chowdhury, S ^c  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^b INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

^c UNIVERSITY OF KALYANI   (India)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; ETCHING; EVAPORATION; ION BEAMS; ION BOMBARDMENT; MIXING; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON; SILVER; SOLUBILITY; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

FULL WIDTH AT HALF MAXIMUM (FWHM); GRAZING INCIDENCE X RAY DIFFRACTION (GIXRD) ANALYSIS; ION BEAM MIXING; MIEDEMA'S METHOD; THERMAL EVAPORATION;

METALLIC FILMS;

EID: 0033742926     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00876-9     Document Type: Article

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