Analysis of the breakdown spots spatial distribution in large area MOS structures

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2010, Pages 775-777

  Miranda, E ^a   O'Connor, E ^b   Hurley, P K ^b  

^a UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

^b UNIVERSITY COLLEGE CORK   (Ireland)

Author keywords

Breakdown; High ; MOS; Reliability

Indexed keywords

BREAKDOWN; BREAKDOWN SPOTS; DIELECTRIC LAYER; MATHEMATICAL TOOLS; MOS; MOS STRUCTURE; POINT PATTERN ANALYSIS; POISSON PROCESS; RELIABILITY TECHNIQUES; SPATIAL DISTRIBUTION;

IMAGE PROCESSING; POISSON DISTRIBUTION; RELIABILITY; SIZE DISTRIBUTION;

QUALITY ASSURANCE;

EID: 77957912912     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2010.5488734     Document Type: Conference Paper

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