How to dip-coat and spin-coat nanoporous double-gyroid silica films with EO19-PO43-EO19 surfactant (Pluronic P84) and know it using a powder X-ray diffractometer

Langmuir

Volumn 26, Issue 6, 2010, Pages 4357-4367

  Tate, Michael P ^a   Urade, Vikrant N ^a   Gaik, Steven J ^a   Muzzillo, Christopher P ^a   Hillhouse, Hugh W ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ACCEPTANCE ANGLE; AGING TIME; CRYSTALLOGRAPHIC PLANE; DIFFRACTION PEAKS; DIP COATING; DOUBLE-GYROID PHASE; EVAPORATION-INDUCED SELF-ASSEMBLY; GI-SAXS; GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING; NANO-POROUS; NANOPOROUS SILICA; NANOPOROUS SILICA FILMS; PLURONICS; POWDER X RAY DIFFRACTION; QUANTITATIVE COMPARISON; RELATIVE HUMIDITIES; SILICA FILM; SOLUTION COMPOSITION; SOLUTION-AGING; TRIBLOCKS; X RAY DIFFRACTOMETERS;

ALKYLATION; ATMOSPHERIC HUMIDITY; DIFFRACTION; DIFFRACTOMETERS; EVAPORATION; NONIONIC SURFACTANTS; SILICA; X RAY DIFFRACTION; X RAY SCATTERING; X RAYS;

COATINGS;

EID: 77957897982     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la903443p     Document Type: Article

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