Measurement of neutron-induced single event transient pulse width narrower than 100ps

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2010, Pages 694-697

  Nakamura, Hideyuki ^a   Tanaka, Katsuhiko ^a   Uemura, Taiki ^a   Takeuchi, Kan ^a   Fukuda, Toshikazu ^a   Kumashiro, Shigetaka ^a  

^a NEC CORPORATION   (Japan)

Author keywords

Combinational logic; Neutron; SEE; SET; Single event effects; Single event transient; Soft errors

Indexed keywords

COMBINATIONAL LOGIC; SEE; SET; SINGLE EVENT EFFECTS; SINGLE EVENT TRANSIENTS; SOFT ERROR;

COMPUTER SIMULATION; COMPUTER TESTING; ERRORS; NEUTRONS;

TRANSIENTS;

EID: 77957892905     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2010.5488749     Document Type: Conference Paper

References (8)

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