Influence of electrical contacts on the 1 /f noise in individual multi-walled carbon nanotubes

Nanotechnology

Volumn 21, Issue 33, 2010, Pages

  Kim, Kanghyun ^a,d   Jang, Doyoung ^a,b   Lee, Kangho ^a   Kang, Haeyong ^a   Yu, Byung Yong ^c   Lee, Jung Il ^c   Kim, Gyu Tae ^a  

^a Korea University   (South Korea)

^b IMEP LAHC   (France)

^c Korea Institute of Science and Technology   (South Korea)

^d Korea Research Institute of Standards and Science   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

1/F NOISE; ELECTRICAL CONTACTS; LOW-FREQUENCY NOISE; METAL CONTACTS; METAL ELECTRODES; OHMIC VOLTAGE; PT ELECTRODE; QUASI-BALLISTIC TRANSPORT; TI ELECTRODE;

BALLISTICS; CHROMIUM; ELECTRIC CONTACTS; ELECTRODES; MULTIWALLED CARBON NANOTUBES (MWCN); PALLADIUM; PLATINUM;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 77957831210     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/33/335702     Document Type: Article

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