SCOPUS 정보 검색 플랫폼

Volumn 108, Issue 6, 2010, Pages

Experiment study of the size effects on electron-phonon relaxation and electrical resistivity of polycrystalline thin gold films

(4) Ma, W G a Wang, H D a Zhang, X a Wang, W b,c

a TSINGHUA UNIVERSITY (China)

b PEKING UNIVERSITY (China)

c Institute of MicroandNano Science and Technology (China)

Author keywords

[No Author keywords available]

Indexed keywords

BULK VALUE; DIFFERENT THICKNESS; ELECTRICAL RESISTIVITY; ELECTRICAL TRANSPORT; ELECTRON-PHONON RELAXATION; EXPERIMENT STUDY; FOUR-PROBE METHODS; POLYCRYSTALLINE; SIZE EFFECTS; THIN GOLD FILM; TRANSIENT THERMOREFLECTANCE TECHNIQUES;

ELECTRIC CONDUCTIVITY; ELECTRON-PHONON INTERACTIONS; GOLD; METALLIC FILMS; SIZE DETERMINATION;

ELECTRONS;

EID: 77957744663 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3482006 Document Type: Article

Times cited : (48)

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