메뉴 건너뛰기




Volumn 108, Issue 6, 2010, Pages

Impurity doping in self-assembled InAs/GaAs quantum dots by selection of growth steps

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER DISTRIBUTIONS; CONDUCTIVE ATOMIC FORCE MICROSCOPY; CURRENT IMAGE; ELECTRICAL CONDUCTIVITY; GROWTH PROCESS; GROWTH STEPS; IMPURITY DOPING; INAS/GAAS QUANTUM DOTS; PHOTOLUMINESCENCE INTENSITIES; SELF-ASSEMBLED; SELF-ASSEMBLING; SI-DOPING; TEMPERATURE QUENCHING;

EID: 77957735270     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3483252     Document Type: Article
Times cited : (32)

References (18)
  • 1
    • 21544475375 scopus 로고
    • APPLAB 0003-6951. 10.1063/1.92959
    • Y. Arakawa and H. Sakaki, Appl. Phys. Lett. APPLAB 0003-6951 40, 939 (1982). 10.1063/1.92959
    • (1982) Appl. Phys. Lett. , vol.40 , pp. 939
    • Arakawa, Y.1    Sakaki, H.2
  • 6
    • 68249143041 scopus 로고    scopus 로고
    • JAPIAU 0021-8979. 10.1063/1.3176903
    • Y. Okada, R. Oshima, and A. Takata, J. Appl. Phys. JAPIAU 0021-8979 106, 024306 (2009). 10.1063/1.3176903
    • (2009) J. Appl. Phys. , vol.106 , pp. 024306
    • Okada, Y.1    Oshima, R.2    Takata, A.3
  • 9
    • 79957929085 scopus 로고    scopus 로고
    • o=161 K from 0 to 80°c
    • DOI 10.1063/1.1476708
    • O. B. Shchekin and D. G. Deppe, Appl. Phys. Lett. APPLAB 0003-6951 80, 3277 (2002). 10.1063/1.1476708 (Pubitemid 34599964)
    • (2002) Applied Physics Letters , vol.80 , Issue.18 , pp. 3277-3279
    • Shchekin, O.B.1    Deppe, D.G.2
  • 11
    • 0036536221 scopus 로고    scopus 로고
    • Evaluation of the fundamental properties of quantum dot infrared detectors
    • DOI 10.1063/1.1455130
    • J. Phillips, J. Appl. Phys. JAPIAU 0021-8979 91, 4590 (2002). 10.1063/1.1455130 (Pubitemid 34435621)
    • (2002) Journal of Applied Physics , vol.91 , Issue.7 , pp. 4590
    • Phillips, J.1
  • 14
    • 54049151979 scopus 로고    scopus 로고
    • JAPIAU 0021-8979. 10.1063/1.2987469
    • T. Kudo, T. Inoue, T. Kita, and O. Wada, J. Appl. Phys. JAPIAU 0021-8979 104, 074305 (2008). 10.1063/1.2987469
    • (2008) J. Appl. Phys. , vol.104 , pp. 074305
    • Kudo, T.1    Inoue, T.2    Kita, T.3    Wada, O.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.