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Volumn 104, Issue 7, 2008, Pages
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Real time analysis of self-assembled InAs/GaAs quantum dot growth by probing reflection high-energy electron diffraction chevron image
a
KOBE UNIVERSITY
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL STRUCTURE;
DIFFRACTION;
ELECTRON DIFFRACTION;
HIGH ENERGY PHYSICS;
OPTICAL WAVEGUIDES;
QUANTUM ELECTRONICS;
REFLECTION;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SEMICONDUCTOR QUANTUM DOTS;
ASSEMBLING PROCESSES;
CAPPING LAYERS;
CRYSTAL FACETS;
INAS/GAAS QUANTUM DOTS;
ISLAND FORMATIONS;
ISLAND SHAPES;
REAL TIMES;
REFLECTION HIGH-ENERGY ELECTRON DIFFRACTIONS;
TAIL STRUCTURES;
TEMPORAL EVOLUTIONS;
TIME ANALYSES;
WETTING LAYERS;
NANOSTRUCTURED MATERIALS;
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EID: 54049151979
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2987469 Document Type: Article |
Times cited : (18)
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References (14)
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