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Thin Solid Films

Volumn 519, Issue 1, 2010, Pages 244-250

In-situ electrical resistance measurement of the selenization process in the CuInGa-Se system

(6) Liu, Wei a Tian, Jian Guo a He, Qing a Li, Feng Yan a Li, Chang Jian a Sun, Yun a

a NANKAI UNIVERSITY (China)

Author keywords

CuInxGa1 xSe2; In situ resistance measurement; Reaction mechanism; Selenization

Indexed keywords

CUINXGA1-XSE2; ELECTRICAL RESISTANCE MEASUREMENT; IN-SITU; PHASE EVOLUTIONS; REACTION MECHANISM; REACTION PATHS; RESISTANCE-TEMPERATURE CURVES; SELENIZATION; XRD PATTERNS;

CRYSTAL STRUCTURE; ELECTRIC RESISTANCE; ELECTRIC RESISTANCE MEASUREMENT; GALLIUM; REACTION KINETICS; X RAY DIFFRACTION;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 77957710911 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2010.08.017 Document Type: Article

Times cited : (11)

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