In situ resistivity measurements during selenization process

Thin Solid Films

Volumn 451-452, Issue , 2004, Pages 245-249

  Kurdesau, F ^a,b   Kaelin, M ^b   Zalesski, V B ^a   Kovalewsky, V I ^a   Gremenok, V F ^c   Zaretskaya, E P ^c   Tiwari, A N ^b,d  

^a B I STEPANOV INSTITUTE OF PHYSICS   (Belarus)

^b ETH ZURICH   (Switzerland)

^c INSTITUTE OF SOLID STATE AND SEMICONDUCTOR PHYSICS   (Belarus)

^d LOUGHBOROUGH UNIVERSITY   (United Kingdom)

Author keywords

Crystalline structure; CuInSe2; Quasi closed system; Selenization

Indexed keywords

ANNEALING; ATMOSPHERIC PRESSURE; AUGER ELECTRON SPECTROSCOPY; CRYSTAL STRUCTURE; EVAPORATION; QUARTZ; SCANNING ELECTRON MICROSCOPY; SELENIUM; STAINLESS STEEL; SURFACE STRUCTURE; THERMAL EFFECTS; THIN FILMS; VAPORS; X RAY DIFFRACTION ANALYSIS;

CRYSTALLINE STRUCTURES; QUASI-CLOSED SYSTEMS; SELENIZATION;

COPPER ALLOYS;

EID: 17644439131     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.10.134     Document Type: Conference Paper

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