SCOPUS 정보 검색 플랫폼

Volumn 519, Issue 1, 2010, Pages 284-288

The growth of nanoscale ZnO films by pulsed-spray evaporation chemical vapor deposition and their structural, electric and optical properties

(2) Jiang, Yinzhu a,b Bahlawane, Naoufal b

a ZHEJIANG UNIVERSITY (China)

b BIELEFELD UNIVERSITY (Germany)

Author keywords

Electrical properties and measurements; Resistivity; Scanning electron microscopy; Spray deposition; Thickness; Zinc oxide

Indexed keywords

ELECTRICAL PROPERTIES AND MEASUREMENTS; RESISTIVITY; SCANNING ELECTRONS; SPRAY DEPOSITION; THICKNESS;

CHEMICAL VAPOR DEPOSITION; CRYSTALLITE SIZE; DEPOSITS; EVAPORATION; FILM GROWTH; GROWTH KINETICS; METALLIC FILMS; NANOSTRUCTURED MATERIALS; OPTICAL DATA PROCESSING; OPTICAL PROPERTIES; ORGANIC LIGHT EMITTING DIODES (OLED); OXIDE FILMS; SCANNING; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THICKNESS MEASUREMENT; THIN FILMS; X RAY DIFFRACTION; ZINC; ZINC OXIDE;

ELECTRIC PROPERTIES;

EID: 77957696518 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2010.07.117 Document Type: Article

Times cited : (3)

References (21)

1
- 53549126062
- G. Malandrino, M. Blandino, M. Fragala, M. Losurdo, and G. Bruno J. Phys. Chem. C 112 2008 9595
- (2008) J. Phys. Chem. C , vol.112 , pp. 9595
- Malandrino, G.¹ Blandino, M.² Fragala, M.³ Losurdo, M.⁴ Bruno, G.⁵

2
- 25144462707
- U. Ozgur, Y.I. Alivov, C. Liu, A. Teke, M.A. Reshchikov, S. Dogan, V. Avrutin, S.J. Cho, and H. Morkoc J. Appl. Phys. 98 2005 041301
- (2005) J. Appl. Phys. , vol.98 , pp. 041301
- Ozgur, U.¹ Alivov, Y.I.² Liu, C.³ Teke, A.⁴ Reshchikov, M.A.⁵ Dogan, S.⁶ Avrutin, V.⁷ Cho, S.J.⁸ Morkoc, H.⁹

3
- 57649218703
- S.K. Kim, and J.Y. Son Electrochem. Solid State Lett. 12 2009 J17
- (2009) Electrochem. Solid State Lett. , vol.12 , pp. 17
- Kim, S.K.¹ Son, J.Y.²

4
- 70349852418
- X.L. Hu, Y. Masuda, T. Ohji, and K. Kato Thin Solid Films 518 2009 638
- (2009) Thin Solid Films , vol.518 , pp. 638
- Hu, X.L.¹ Masuda, Y.² Ohji, T.³ Kato, K.⁴

5
- 63049114853
- Y. Zhang, J.Q. Xu, Q. Xiang, H. Li, Q.Y. Pan, and P.C. Xu J. Phys. Chem. C 113 2009 3430
- (2009) J. Phys. Chem. C , vol.113 , pp. 3430
- Zhang, Y.¹ Xu, J.Q.² Xiang, Q.³ Li, H.⁴ Pan, Q.Y.⁵ Xu, P.C.⁶

6
- 0035470756
- T. Suzuki, I. Kosacki, H.U. Anderson, and P. Colomban J. Am. Ceram. Soc. 84 2001 2007
- (2001) J. Am. Ceram. Soc. , vol.84 , pp. 2007
- Suzuki, T.¹ Kosacki, I.² Anderson, H.U.³ Colomban, P.⁴

7
- 0346910176
- J.J. Chen, Y. Gao, F. Zeng, D.M. Li, and F. Pan Appl. Surf. Sci. 223 2004 318
- (2004) Appl. Surf. Sci. , vol.223 , pp. 318
- Chen, J.J.¹ Gao, Y.² Zeng, F.³ Li, D.M.⁴ Pan, F.⁵

8
- 67049099196
- B. Wang, J.H. Min, Y. Zhao, W.B. Sang, and C.J. Wang Appl. Phys. Lett. 94 2009 192101
- (2009) Appl. Phys. Lett. , vol.94 , pp. 192101
- Wang, B.¹ Min, J.H.² Zhao, Y.³ Sang, W.B.⁴ Wang, C.J.⁵

9
- 0036603403
- M.K. Jayaraj, A. Antony, and M. Ramachandran Bull. Mater. Sci. 25 2002 227
- (2002) Bull. Mater. Sci. , vol.25 , pp. 227
- Jayaraj, M.K.¹ Antony, A.² Ramachandran, M.³

10
- 14544295764
- S.K. Kim, C.S. Hwang, S.H.K. Park, and S.J. Yun Thin Solid Films 478 2005 103
- (2005) Thin Solid Films , vol.478 , pp. 103
- Kim, S.K.¹ Hwang, C.S.² Park, S.H.K.³ Yun, S.J.⁴

11
- 34548864319
- P.A. Premkumar, N. Bahlawane, and K. Kohse-Höinghaus Chem. Vap. Deposition 13 2007 219
- (2007) Chem. Vap. Deposition , vol.13 , pp. 219
- Premkumar, P.A.¹ Bahlawane, N.² Kohse-Höinghaus, K.³

12
- 77957707138
- JCPDS-International Center for Diffraction Data [DB/MT], PCPDFWIN, V. 2. 02
- JCPDS-International Center for Diffraction Data [DB/MT], PCPDFWIN, V. 2. 02, 1999.
- (1999)

13
- 51849104724
- S. Jeon, S. Bang, S. Lee, S. Kwon, W. Jeong, H. Jeon, H.J. Chang, and H.H. Park J. Electrochem. Soc. 155 2008 H738
- (2008) J. Electrochem. Soc. , vol.155 , pp. 738
- Jeon, S.¹ Bang, S.² Lee, S.³ Kwon, S.⁴ Jeong, W.⁵ Jeon, H.⁶ Chang, H.J.⁷ Park, H.H.⁸

14
- 17044394360
- Y. Kajikawa, and S. Noda Appl. Surf. Sci. 245 2005 281
- (2005) Appl. Surf. Sci. , vol.245 , pp. 281
- Kajikawa, Y.¹ Noda, S.²

15
- 33846667762
- Y.Z. Jiang, M.F. Liu, Y.Y. Wang, H.Z. Song, J.F. Gao, and G.Y. Meng J. Phys. Chem. A 110 2006 13479
- (2006) J. Phys. Chem. A , vol.110 , pp. 13479
- Jiang, Y.Z.¹ Liu, M.F.² Wang, Y.Y.³ Song, H.Z.⁴ Gao, J.F.⁵ Meng, G.Y.⁶

16
- 16444375543
- R.J. Elliott Phys. Rev. 108 1959 1384
- (1959) Phys. Rev. , vol.108 , pp. 1384
- Elliott, R.J.¹

17
- 77951822504
- D. Yiamsawas, K. Boonpavanitchakul, and W. Kangwansupamonkon J. Microsc. Soc. Thailand 23 2009 75
- (2009) J. Microsc. Soc. Thailand , vol.23 , pp. 75
- Yiamsawas, D.¹ Boonpavanitchakul, K.² Kangwansupamonkon, W.³

18
- 77957711927
- J.F. Muth, and R.M. Kolbas J. Appl. Phys. 85 1999 7885
- (1999) J. Appl. Phys. , vol.85 , pp. 7885
- Muth, J.F.¹ Kolbas, R.M.²

19
- 19544383241
- Z.G. Yao, X.Q. Zhang, H.K. Shang, X.Y. Teng, Y.S. Wang, and S.H. Huang Chin. Phys. 14 2005 1205
- (2005) Chin. Phys. , vol.14 , pp. 1205
- Yao, Z.G.¹ Zhang, X.Q.² Shang, H.K.³ Teng, X.Y.⁴ Wang, Y.S.⁵ Huang, S.H.⁶

20
- 55149117115
- J.C. Nie, J.Y. Yang, Y. Piao, H. Li, Y. Sun, Q.M. Xue, C.M. Xiong, R.F. Dou, and Q.Y. Tu Appl. Phys. Lett. 93 2008 173104
- (2008) Appl. Phys. Lett. , vol.93 , pp. 173104
- Nie, J.C.¹ Yang, J.Y.² Piao, Y.³ Li, H.⁴ Sun, Y.⁵ Xue, Q.M.⁶ Xiong, C.M.⁷ Dou, R.F.⁸ Tu, Q.Y.⁹

21
- 77949779905
- Y.Z. Jiang, and N. Bahlawane J. Phys. Chem. C 114 2010 5121
- (2010) J. Phys. Chem. C , vol.114 , pp. 5121
- Jiang, Y.Z.¹ Bahlawane, N.²

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