Electrical Conductivity and Lattice Defects in Nanocrystalline Cerium Oxide Thin Films

Journal of the American Ceramic Society

Volumn 84, Issue 9, 2001, Pages 2007-2014

  Suzuki, Toshio ^a   Kosacki, Igor ^a   Anderson, Harlan U ^a   Colomban, Philippe ^b  

^a MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

^b SORBONNE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; ELECTRIC CONDUCTIVITY; ELECTRIC CONDUCTIVITY MEASUREMENT; ENTHALPY; GRAIN SIZE AND SHAPE; NANOSTRUCTURED MATERIALS; OXIDES; OXYGEN; RAMAN SCATTERING; SPIN COATING; TEMPERATURE; THIN FILMS;

CERIUM OXIDE THIN FILMS; OXYGEN ACTIVITY; RAMAN SCATTERING MEASUREMENT;

CERIUM COMPOUNDS;

EID: 0035470756     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2001.tb00950.x     Document Type: Article

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