Sensor properties and surface characterization of aluminum-deposited SPR optical fibers

Sensors and Actuators, A: Physical

Volumn 163, Issue 1, 2010, Pages 1-8

  Mitsushio, Masaru ^a   Watanabe, Kensaku ^a,b   Abe, Yasuyuki ^a,c   Higo, Morihide ^a  

^a KAGOSHIMA UNIVERSITY   (Japan)

^b KYOCERA CORPORATION   (Japan)

^c Hachioji shi   (Japan)

Author keywords

Al deposited optical fiber sensor; Atomic force microscopy (AFM); Surface oxide layer; Surface plasmon resonance (SPR); X ray photoelectron spectroscopy (XPS)

Indexed keywords

AL FILMS; ATOMIC FORCE MICROSCOPY (AFM); NATIVE OXIDE LAYER; OPTICAL FIBER SENSOR; OXIDE LAYER; REFLECTION PROPERTIES; RESPONSE CURVES; RESPONSE RANGE; SENSOR PROPERTIES; SMALL GRAINS; SURFACE CHARACTERIZATION; SURFACE HEIGHT; SURFACE OXIDE LAYER; SURFACE PLASMON RESONANCE (SPR); THEORETICAL EQUATION; XPS ANALYSIS;

ALUMINUM; ALUMINUM COATINGS; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; ATOMS; COMPOSITE STRUCTURES; ELECTRONS; FIBER OPTIC SENSORS; FIBER OPTICS; FIBERS; GOLD COATINGS; METALLIC FILMS; OPTICAL FIBERS; OXIDE FILMS; PHOTOELECTRICITY; PHOTONS; PLASMONS; SENSORS; SURFACE PLASMON RESONANCE; SURFACE PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

OPTICAL FILMS;

EID: 77957680822     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2010.07.003     Document Type: Article

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