Application of surface plasmon polaritons in the laser ablation and characterisation of thin aluminium films

Surface Science

Volumn 429, Issue 1, 1999, Pages 117-126

  Cairns, G F ^a   McNeill, D A ^a   Dawson, P ^a  

^a QUEEN'S UNIVERSITY BELFAST   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; INTERFACES (MATERIALS); LASER ABLATION; OXIDATION; OXIDES; SURFACE TREATMENT; SURFACES; THIN FILMS;

ALUMINUM FILMS; ALUMINUM OXIDE; METAL INSULATOR INTERFACES; SURFACE PLASMON POLARITON;

METALLIC FILMS;

EID: 0032651538     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00354-4     Document Type: Article

References (34)

1. Fogarassy E., Geohegan D.B., Stuke M. Laser Ablation, Proceedings of Symposium F, Third International Conference on Laser Ablation (COLA 95). 1996;Elsevier, Amsterdam.
2. Russo R.E., Geohegan D.B., Haglund R.F. Jr., Murakami K. Laser Ablation, Proceedings of the Fourth International Conference on Laser Ablation (COLA 97). 1998;Elsevier, Amsterdam.
3. Pines D., Bohm D. Phys. Rev. 82:1951;625.
4. Pines D., Bohm D. Phys. Rev. 85:1952;338.
5. Pines D., Bohm D. Phys. Rev. 92:1953;609.
6. Ritchie R.H. Phys. Rev. 106:1957;874.
7. Otto A. Phys. Stat. Sol. 26:1968;K99.
8. Otto A. Z. Physik. 216:1968;398.
9. Kretschmann E., Raether H. Z. Natursforsch. 23A:1968;2135.
10. Smith D.Y., Shiles E., Inokuti M. Palik E.D. Handbook of Optical Constants of Solids. 1985;405 Academic Press, New York.
11. Lee I., Parks J.E., Calcott T.A., Arakawa E.T. Phys. Rev. B. 39:1989;8012.
12. Lee I., Calcott T.A., Arakawa E.T. Phys. Rev. B. 47:1993;6661.
13. Shea M.J., Compton R.N. Phys. Rev. B. 47:1996;9967.
14. Dawson P., Cairns G.F. J. Mod. Opt. 41:1994;1287.
15. McNeill D.A., Morrow T., Dawson P. Appl. Surf. Sci. 127-129:1998;46.
16. Lee I., Calcott T.A., Arakawa E.T. Anal. Chem. 64:1992;476.
17. Owega S., Lai E.P.C., Bawagan A.D.O. Anal. Chem. 70:1997;2360.
18. Hoheisel W., Jungmann K., Vollmer M., Weidenauer R., Trager F. Phys. Rev. Lett. 60:1988;1649.
19. Vollmer M., Weidenauer R., Hoheisel W., Schulte U., Träger F. Phys. Rev. B. 40:1989;12509.
20. Hoheisel W., Schulte U., Vollmer M., Wiedenauer R., Träger F. Appl. Surf. Sci. 36:1989;664.
21. Hoheisel W., Schulte U., Vollmer M., Träger F. Appl. Phys. A. 51:1990;271.
22. Hoheisel W., Vollmer M., Träger F. Phys. Rev. B. 48:1993;17463.
23. Stietz F., Stuke M., Viereck J., Wenzel T., Träger F. Surf. Sci. 389:1997;L1153.
24. Stietz F., Stuke M., Viereck J., Wenzel T., Träger F. Appl. Surf. Sci. 127-129:1998;64.
25. Jaklevic R.C., Lambe J. Phys. Rev. Lett. 17:1966;1139.
26. Hansma P.K. Phys. Rep., Phys. Lett. Sect. C. 30:1976;145.
27. Hagemann H.J., Gudat W., Kunz C. J. Opt. Soc. Am. 65:1975;742.
28. Malitson I.H. J. Opt. Soc. Am. 52:1962;1377.
29. Tews W., Grundler R. Phys. Stat. Sol. (b). 109:1982;255.
30. Maxwell-Garnet J.C. Phil. Trans. Roy. Soc. 147:1904;145.
31. Ritchie R.H., Manson J.R., Echenique P.M. Phys. Rev. B. 49:1994;2963.
32. Monreal R., Apell S.P. Phys. Rev. B. 41:1990;7852.
33. Wu Z. Phys. Lett. A. 131:1988;486.
34. Chen L., Liberman V., O'Neill J.A., Wu Z., Osgood R.M. Jr. J. Vac. Sci. Technol. A. 6:1988;1426.