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Volumn 5, Issue 4, 2009, Pages 157-168

Buckling-based measurements of mechanical moduli of thin films

Author keywords

Buckling; Elastic modulus; Organic semiconductor materials

Indexed keywords

EXISTING METHOD; MECHANICAL CHARACTERIZATIONS; MECHANICAL MODULUS; MECHANICAL PROPERTIES OF MATERIALS; ORGANIC ELECTRONIC MATERIALS; ORGANIC SEMICONDUCTOR; POLYELECTROLYTE MULTILAYER; POLYMER NETWORKS; SINGLE-WALL CARBON NANOTUBES; STRETCHABLE ELECTRONICS;

EID: 77957674456     PISSN: 17388090     EISSN: None     Source Type: Journal    
DOI: 10.3365/eml.2009.12.157     Document Type: Article
Times cited : (15)

References (45)
  • 23


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.