Mo bilayer for thin film photovoltaics revisited

Journal of Physics D: Applied Physics

Volumn 43, Issue 34, 2010, Pages

  Salome P M P ^a   Malaquias, J ^a   Fernandes, P A ^a,b   Da Cunha, A F ^a  

^a UNIVERSITY OF AVEIRO   (Portugal)

^b INSTITUTO SUPERIOR DE ENGENHARIA DO PORTO   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORBER LAYERS; BACK CONTACT; BI-LAYER; BOTTOM LAYERS; CU(IN , GA)SE; DEPOSITION CONDITIONS; LOW RESISTIVITY; SHEET RESISTIVITY; SODA LIME GLASS; STRESS STATE; THIN FILM PHOTOVOLTAICS; THIN FILM SOLAR CELLS;

ADHESION; GALLIUM; MOLYBDENUM; SEMICONDUCTING SELENIUM COMPOUNDS; THIN FILMS;

COPPER;

EID: 77957160379     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/43/34/345501     Document Type: Article

References (15)

1. Dhere N G 2007 Sol. Energy Mater. Sol. Cells 91 1376-1382
2. Green M A 2006 Prog. Photovolt. Res. Appl. 14 383-392
3. Rudmann D 2004 Effects of sodium on growth and properties of Cu(In,Ga)Se2 thin films and solar cells PhD Dissertation ETH No 15576, Eidgenössische Technische Hochschule Zürich
4. Assmann L, Bernéde J C, Drici A, Amory C, Halgand E and Morsli M 2005 Appl. Surf. Sci. 246 159-166
5. Wada T, Koharab N, Nishiwaki S and Negami T 2001 Thin Solid Films 387 118-122
6. Ullal H S and von Roeder B 2008 Solid State Technol. 51 2
7. Čampa A, Krč J, Malmström J, Edoff M, Smole F and Topič M 2007 Thin Solid Films 515 5968-5972
8. Orgassa K, Schock H W and Werner J H 2003 Thin Solid Films 431 387-391
9. Vink T J, Somers M A J, Daams J L C and Dirks A G 1991 J. Appl. Phys. 70 4301-4308
10. Scofield J H, Duda A, Albin D, Ballard B L and Predecki P K 1995 Thin solid Films 260 26-31
11. Bunshah R F 1994 Handbook of Deposition Technologies for Films and Coatings-Science, Technology and Applications 2nd edn (New York: William Andrew Publishing/Noyes)
12. Mattox D M 1998 Handbook of Physical Vapor Deposition (PVD) Processing (New York: William Andrew Publishing/Noyes)
13. Welzel U, Ligot J, Lamparter P, Vermeulen A C and Mittemeijer E J 2005 J. Appl. Crystallogr. 38 1-29
14. Guillén C and Herrero J 2003 J. Mater. Process. Technol. 143-144 144-147
15. International Centre for Diffraction Data 04-001-2734