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Journal of Chemical Physics

Volumn 133, Issue 10, 2010, Pages

Laser-induced scanning tunneling microscopy: Linear excitation of the junction plasmon

(4) Lee, Joonhee a Perdue, Shawn M a Whitmore, Desiŕ a Apkarian, V Ara a

a UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTO-OPTIC MODULATOR; AG ATOMS; ANISOTROPIC SUSCEPTIBILITIES; BAND FREQUENCIES; CARRIER FREQUENCY; CROSS CORRELATIONS; CROSS-POLARIZED; DIRECT DETECTION; FEMTOSECOND LASER PULSE; LASER INDUCED; LINEAR COUPLING; LOCALIZED EXCITATIONS; MECHANICAL DISPLACEMENTS; POLARIZATION DEPENDENCE; PULSE TRAIN; RADIATION FLUXES; RELATIVE SHIFT; REPETITION FREQUENCY; SCANNING TUNNELING MICROSCOPES; TI: SAPPHIRE LASER; TUNNELING CURRENT;

ELECTRON TUNNELING; LASER EXCITATION; LOCOMOTIVES; PLASMONS; RAILROAD CARS; RAILROAD TUNNELS; SCANNING TUNNELING MICROSCOPY; SILVER; ULTRAFAST LASERS; ULTRASHORT PULSES;

PULSED LASER APPLICATIONS;

SILVER;

ARTICLE; CHEMISTRY; LASER; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTY;

LASERS; MICROSCOPY, SCANNING TUNNELING; SILVER; SURFACE PROPERTIES;

EID: 77956916407 PISSN: 00219606 EISSN: None Source Type: Journal
DOI: 10.1063/1.3490398 Document Type: Article

Times cited : (18)

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