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Volumn 108, Issue 5, 2010, Pages

Photodeterioration of the silicon nanocrystal emission

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX EVOLUTIONS; DAMAGING MECHANISM; ENERGY SHIFT; EXPOSURE-TIME; LASER INTENSITIES; PL EMISSION; PUMPING INTENSITY; SAMPLE HEATING; SILICON NANOCRYSTALS; TIME-SCALES;

EID: 77956851672     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3475791     Document Type: Article
Times cited : (6)

References (21)
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    • Franceschetti, A.1
  • 20
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    • Oxidation effects on the photoluminescent properties of Si nanocrystalline thin films
    • DOI 10.1016/j.optmat.2004.08.049, PII S0925346704002629, Si-Based Photonics: Towards True Monolithic Integration
    • K. A. Jeon, J. H. Kim, G. H. Kim, and S. Y. Lee, Opt. Mater. (Amsterdam, Neth.) OMATET 0925-3467 27, 988 (2005). 10.1016/j.optmat.2004.08.049 (Pubitemid 40211967)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.