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Journal of Applied Physics

Volumn 108, Issue 5, 2010, Pages

Reduced leakage current in BiFeO3 - BiCrO3 nanocomposite films formed by chemical solution deposition

(3) Singh, Sushil K a,b Shanthy, S c Ishiwara, H b,d

a SOLID STATE PHYSICS LABORATORY (India)

b TOKYO INSTITUTE OF TECHNOLOGY (Japan)

c UNIVERSITY OF ALLAHABAD (India)

d Konkuk University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED ELECTRIC FIELD; APPLIED FIELD; BFO FILMS; CHEMICAL SOLUTION DEPOSITION; FATIGUE RESPONSE; FOUR-ORDER; IMPURITY PHASE; INTER-GRAIN; LOW-LEAKAGE CURRENT; NANO GRAINS; NANOCOMPOSITE FILM; OHMIC CONDUCTION; POLYCRYSTALLINE COMPOSITES; REMANENT POLARIZATION; SI(1 0 0); SMALL GRAINS; SOL GEL SOLUTIONS; SWITCHING CYCLES;

ANNEALING; ELECTRIC FIELDS; GELS; GRAIN BOUNDARIES; LEAKAGE CURRENTS; NANOCOMPOSITES; OXYGEN; OXYGEN VACANCIES; SILICON COMPOUNDS; STRONTIUM COMPOUNDS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

COMPOSITE FILMS;

EID: 77956840201 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3467965 Document Type: Article

Times cited : (14)

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