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Volumn , Issue , 2008, Pages
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Stress induced degradation modes in CIGS mini-modules
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Author keywords
[No Author keywords available]
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Indexed keywords
ACCELERATED STRESS TESTING;
CELL INTEGRATION;
FAILURE MECHANISM;
MONOLITHICALLY INTEGRATED;
SERIES RESISTANCES;
STRESS-INDUCED DEGRADATION;
THIN FILM SOLAR CELLS;
TRANSPARENT CONDUCTING OXIDE;
ELECTRIC RESISTANCE;
ELECTRONIC EQUIPMENT TESTING;
ETHYLENE;
MONOLITHIC INTEGRATED CIRCUITS;
SILICONES;
SEMICONDUCTING SELENIUM COMPOUNDS;
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EID: 84879701012
PISSN: 01608371
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/PVSC.2008.4922497 Document Type: Conference Paper |
Times cited : (29)
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References (6)
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