Polarization dependence and symmetry analysis in indirect K -edge RIXS

Physical Review B - Condensed Matter and Materials Physics

Volumn 82, Issue 3, 2010, Pages

  Chabot Couture, G ^a   Hancock, J N ^b   Mang, P K ^a   Casa, D M ^c   Gog, T ^c   Greven, M ^d  

^a STANFORD UNIVERSITY   (United States)

^b UNIVERSITY OF GENEVA   (Switzerland)

^c ARGONNE NATIONAL LABORATORY   (United States)

^d University of Minnesota   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77956709777     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.82.035113     Document Type: Article

References (58)

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29. The goodness-of-fit indicator (G) is another metric to quantify the quality of a fit. It depends on the number of degrees of freedom and the χ 2 such that, given a chi-square distribution, G is the probability that a randomly obtained χ 2 value be bigger than the one resulting from the fit. Typically, a fit with G above 10% is judged good. However, this value is not hard set and the distribution of errors or their systematics should be taken into account and can make smaller values of G acceptable.
30. The ratio of the integrated spectral weight in the σ 2 and σ 1 channels for SW2 normalization is 39% compared to 15% for FM + SA.
31. They correspond to an increase in the RIXS spectral weight towards backscattering.
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