Polarization dependence of L- and M-edge resonant inelastic X-ray scattering in transition-metal compounds

Physical Review Letters

Volumn 96, Issue 11, 2006, Pages

  Van Veenendaal, Michel ^a,b  

^a NORTHERN ILLINOIS UNIVERSITY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC PEAK; L-EDGE RIXS; M-EDGE RIXS; RESONANT INELASTIC X-RAY SCATTERING (RIXS); SPIN-FLIP;

ANGLE MEASUREMENT; COPPER COMPOUNDS; POLARIZATION; RESONANCE; SUPERCONDUCTING MATERIALS; TECHNETIUM COMPOUNDS; X RAY SCATTERING;

TRANSITION METAL COMPOUNDS;

EID: 33645143486     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.96.117404     Document Type: Article

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