Crystal field and low energy excitations measured by high resolution RIXS at the L3 edge of Cu, Ni and Mn

European Physical Journal: Special Topics

Volumn 169, Issue 1, 2009, Pages 199-205

  Ghiringhelli, Giacomo ^a   Piazzalunga, A ^a   Wang, X ^b   Bendounan, A ^c   Berger, H ^b   Bottegoni, F ^a   Christensen, N ^c   Dallera, C ^a   Grioni, M ^b   Grivel, J C ^d   Moretti Sala, M ^a   Patthey, L ^e   Schlappa, J ^e   Schmitt, T ^e   Strocov, V ^e   Braicovich, L ^a  

^a POLITECNICO DI MILANO   (Italy)

^b EPFL   (Switzerland)

^c ETH ZURICH   (Switzerland)

^d TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^e PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 65649103046     PISSN: 19516355     EISSN: 19516401     Source Type: Journal    
DOI: 10.1140/epjst/e2009-00993-8     Document Type: Conference Paper

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