Quantitative analysis of graded Cu(In 1-x ,Ga x )Se 2 thin films by AES, ICP-OES, and EPMA

Applied Surface Science

Volumn 257, Issue 3, 2010, Pages 878-886

  Perkins, Craig L ^a   Egaas, Brian ^a   Repins, Ingrid ^a   To, Bobby ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

Auger; CIGS; Electron probe microanalysis; Photovoltaics; Solar

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; AUGERS; DEPTH PROFILING; INDUCTIVELY COUPLED PLASMA; OPTICAL EMISSION SPECTROSCOPY; PHOTOVOLTAIC EFFECTS; PROBES; SEMICONDUCTOR DEVICES; SOLAR CELLS; SOLAR POWER GENERATION; SPECTROMETRY; THIN FILMS;

AUGER ELECTRON SPECTROSCOPIES (AES); CIGS; HIGH PERFORMANCE DEVICES; INDUCTIVELY COUPLED PLASMA-OPTICAL EMISSION SPECTROMETRY; PHOTOVOLTAICS; QUATERNARY SEMICONDUCTORS; SOLAR; SPUTTER-DEPTH PROFILING;

ELECTRON PROBE MICROANALYSIS;

EID: 77956617460     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.07.085     Document Type: Article

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