Material losses and compositional changes in two-step processed CuInSe2 thin films

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 10, 2000, Pages 5776-5780

  Alberts, V ^a   Klenk, M ^b   Bucher, E ^b  

^a UNIVERSITY OF JOHANNESBURG   (South Africa)

^b UNIVERSITY OF KONSTANZ   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER COMPOUNDS; FLUORESCENCE; MICROANALYSIS; PHASE TRANSITIONS; SEGREGATION (METALLOGRAPHY); SEMICONDUCTOR GROWTH; TEMPERATURE; X RAY ANALYSIS;

CHALCOPYRITE THIN FILMS; ELECTRON PROBE MICROANALYSIS; MATERIAL LOSSES; SELENIZATION; X RAY FLUORESCENCE;

THIN FILMS;

EID: 0034291382     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.5776     Document Type: Article

References (7)

1. K. Kushiya, A. Shimizu, A. Yamada and M. Konagai: Jpn. J. Appl. Phys. 34 (1995) 54.
2. F. Karg, V. Probst, H. Harms, J. Rimmasch, W. Rieidl, A. Mitwalski and A. Kiedl: Proc. 23rd IEEE Photovoltaic Specialists Conference, Louisville, 1993, p. 441.
3. J. Kessler, H. Dittrich, F. Grunwald and H. W. Schock: Proc. 10th European Photovoltaic Conf., Lisbon, 1991, p. 879.
4. M. Klenk, O. Schenker, U. Probst and E. Bucher: Sol Energy Mater. & Sol. Cells 58 (1999) 299.
5. R. Klenk, H. W. Schock, D. Cahen, T. Engelhard and E. Mans: Proc. 10th European Photovoltaic Conf., Lisbon, 1991, p. 101.
6. H. Lowe, P. Keppler and D. Zach: Halbleiterätzverfahren (Akademie-verslag, Berlin, 1990) p. 138.
7. J. C. W. Folmer, J. A. Turner, R. Noufi and D. Cahen: J. Electrochem. Soc. 132 (1985) 1319.