Extracting physically interpretable data from electron energy-loss spectra

Ultramicroscopy

Volumn 110, Issue 11, 2010, Pages 1390-1396

  Witte, C ^a   Zaluzec, N J ^b   Allen, L J ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Electron energy loss spectroscopy (EELS); Principal component analysis; Theory of inelastic electron scattering

Indexed keywords

CARBON K-EDGE; DATA SETS; ELECTRON ENERGY-LOSS SPECTRA; INELASTIC ELECTRON SCATTERING; LINEARLY POLARIZED; PRINCIPAL COMPONENTS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPE;

DISSOCIATION; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; NUCLEAR INSTRUMENTATION; PRINCIPAL COMPONENT ANALYSIS; PROBES; SPECTRUM ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

CARBON; GRAPHITE;

ARTICLE; CONTROLLED STUDY; DATA EXTRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; GEOMETRY; LIGHT SCATTERING; PRINCIPAL COMPONENT ANALYSIS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY;

EID: 77956227895     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.07.003     Document Type: Article

References (31)

1. Moreno M.S., Jorissen K., Rehr J.J. Practical aspects of electron energy-loss spectroscopy (EELS) calculations using FEFF8. Micron 2007, 38(1):1-11.
2. Edgerton R.F. Electron Energy-loss Spectroscopy in the Electron Microscope 1996, Plenum Press, New York.
3. Krivanek O.L., Disko M.M., Taftø J., Spence J.C.H. Electron-energy loss spectroscopy as a probe of the local atomic environment. Ultramicroscopy 1982, 9(3):249-254.
4. Rez P., Bruley J., Brohan P., Payne M., Garvie L.A.J. Review of methods for calculating near-edge structure. Ultramicroscopy 1995, 59(1-4):159-167.
5. Keast V.J., Scott A.J., Brydson R., Williams D.B., Bruley J. Electron energy-loss near-edge structure-a tool for the investigation of electronic structure on the nanometre scale. Journal of Microscopy-Oxford 2001, 203:135-175.
6. Varela M., Findlay S.D., Lupini A.R., Christen H.M., Borisevich A.Y., Dellby N., Krivanek O.L., Nellist P.D., Oxley M.P., Allen L.J., Pennycook S.J. Spectroscopic imaging of single atoms within a bulk solid. Physical Review Letters 2004, 92(9):095502.
7. Okunishi E., Sawada H., Kondo J., Kersker M. Atomic resolution elemental map of EELS with a Cs corrected STEM. Microscopy and Microanalysis 2006, 12(Supplement 02):1150-1151.
8. Bosman M., Keast V.J., Garcia-Munoz J.L., D'Alfonso A.J., Findlay S.D., Allen L.J. Two-dimensional mapping of chemical information at atomic resolution. Physical Review Letters 2007, 99(8):086102.
9. Kimoto K., Asaka T., Nagai T., Saito M., Matsui Y., Ishizuka K. Element-selective imaging of atomic columns in a crystal using STEM and EELS. Nature 2007, 450(7170):702-704.
10. Muller D.A., Kourkoutis L.F., Murfitt M., Song J.H., Hwang H.Y., Silcox J., Dellby N., Krivanek O.L. Atomic-scale chemical imaging of composition and bonding by aberration-corrected microscopy. Science 2008, 319(5866):1073-1076.
11. Allen L.J. Electron microscopy-new directions for chemical maps. Nature Nanotechnology 2008, 3(5):255-256.
12. Bonnet N., Brun N., Colliex C. Extracting information from sequences of spatially resolved EELS spectra using multivariate statistical analysis. Ultramicroscopy 1999, 77(3-4):97-112.
13. Zaluzec N.J., Blackford M.G., Smith K.L., Colella M. HARECES measurements of carbon K shell excitation in graphite. Microscopy and Microanalysis 2005, 11(S2):718-719.
14. Browning N.D., Yuan J., Brown L.M. Real-space determination of anisotropic electronic-structure by electron-energy loss spectroscopy. Ultramicroscopy 1991, 38(3-4):291-298.
15. Leapman R.D., Fejes P.L., Silcox J. Orientation dependence of core edges from anisotropic materials determined by inelastic-scattering of fast electrons. Physical Review B 1983, 28(5):2361-2373.
16. Jolliffe I.T. Principal Component Analysis 1986, Springer-Verlag, New York.
17. Keenan M.R., Kotula P.G. Accounting for Poisson noise in the multivariate analysis of ToF-SIMS spectrum images. Surface and Interface Analysis 2004, 36:203-212.
18. Allen L.J., Findlay S.D., Oxley M.P., Witte C., Zaluzec N.J. Channeling effects in high-angular-resolution electron spectroscopy. Physical Review B 2006, 73(9):094104.
19. Witte C., Findlay S.D., Oxley M.P., Rehr J.J., Allen L.J. Theory of dynamical scattering in near-edge electron energy loss spectroscopy. Physical Review B 2009, 80(18):184108.
20. Schattschneider P., Hébert C., Franco H., Jouffrey B. Anisotropic relativistic cross sections for inelastic electron scattering, and the magic angle. Physical Review B 2005, 72(4):045142.
21. Le Bossé J.C., Épicier T., Jouffrey B. Polarization dependence in ELNES: influence of probe convergence, collector aperture and electron beam incidence angle. Ultramicroscopy 2006, 106(6):449-460.
22. Leapman R.D., Silcox J. Orientation dependence of core edges in electron-energy-loss spectra from anisotropic materials. Physical Review Letters 1979, 42(20):1361-1364.
23. Nelhiebel M., Louf P.H., Schattschneider P., Blaha P., Schwarz K., Jouffrey B. Theory of orientation-sensitive near-edge fine-structure core-level spectroscopy. Physical Review B 1999, 59(20):12807-12814.
24. Jouffrey B., Schattschneider P., Hébert C. The magic angle: a solved mystery. Ultramicroscopy 2004, 102(1):61-66.
25. Hébert C., Schattschneider P., Franco H., Jouffrey B. ELNES at magic angle conditions. Ultramicroscopy 2006, 106(11-12):1139-1143.
26. Brouder C. Angular-dependence of X-ray absorption-spectra. Journal of Physics: Condensed Matter 1990, 2(3):701-738.
27. Brouder C., Ruiz López M.F., Benfatto M., Natoli C.R., Pettifer R.F. Systematic-approach to the calculation of the polarization-dependent (and polarization-averaged) general term of the curved-wave multiple-scattering series in the X-ray-absorption cross-section. Physical Review B 1989, 39(3):1488-1500.
28. Le Bossé J.C., Épicier T., Chermette H. Trichroism in energy-loss near-edge structure spectroscopy: polarization dependence of near-edge fine structures. Physical Review B 2007, 76(7):075127.
29. Radtke G., Epicier T., Bayle-Guillemaud P., Le Bosse J.C. N-K ELNES study of anisotropy effects in hexagonal AlN. Journal of Microscopy 2003, 210:60-65.
30. Disko M.M., Krivanek O.L., Rez P. Orientation-dependent extended fine-structure in electron-energy-loss spectra. Physical Review B 1982, 25(6):4252-4255.
31. Rosenberg R.A., Love P.J., Rehn V. Polarization-dependent C(K) near-edge X-ray-absorption fine-structure of graphite. Physical Review B 1986, 33(6):4034-4037.