Toward efficient large-scale performance modeling of integrated circuits via multi-mode/multi-corner sparse regression

Proceedings - Design Automation Conference

Volumn , Issue , 2010, Pages 897-902

  Zhang, Wangyang ^a   Chen, Tsung Hao ^a   Ting, Ming Yuan ^a   Li, Xin ^b  

^a MENTOR GRAPHICS CORPORATION   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Performance modeling; Process variations

Indexed keywords

BAYESIAN INFERENCE; COMPUTATIONAL COSTS; INDUSTRIAL CIRCUITS; LEAST SQUARES REGRESSION; MODEL TEMPLATES; MODELING ACCURACY; PERFORMANCE CORRELATION; PERFORMANCE MODEL; PERFORMANCE MODELING; PRIOR DISTRIBUTION; PROCESS VARIATION; SPARSE REGRESSION; WORKING MODE;

BAYESIAN NETWORKS; COMPUTER AIDED DESIGN; INFERENCE ENGINES; INTEGRATED CIRCUITS; REGRESSION ANALYSIS;

COMPUTER SIMULATION;

EID: 77956221749     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1837274.1837500     Document Type: Conference Paper

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