Statistical regression for efficient high-dimensional modeling of analog and mixed-signal performance variations

Proceedings - Design Automation Conference

Volumn , Issue , 2008, Pages 38-43

  Li, Xin ^a   Liu, Hongzhou ^b  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b CADENCE DESIGN SYSTEMS   (United States)

Author keywords

Circuits; Process variations; Response surface modeling

Indexed keywords

CIRCUITS; HIGH-DIMENSIONAL; PROCESS VARIATIONS; RESPONSE SURFACE MODELING;

ARSENIC COMPOUNDS; COMPUTER AIDED DESIGN; COMPUTER NETWORKS; DIGITAL INTEGRATED CIRCUITS; INDUSTRIAL ENGINEERING; SURFACE PROPERTIES;

LINEAR EQUATIONS;

EID: 51549110022     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DAC.2008.4555778     Document Type: Conference Paper

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