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Volumn 97, Issue 3, 2010, Pages

Analysis of InAs vertical and lateral band-to-band tunneling transistors: Leveraging vertical tunneling for improved performance

Author keywords

[No Author keywords available]

Indexed keywords

BAND TO BAND TUNNELING; CRITICAL THICKNESS; HEAVILY DOPED; INAS; ON CURRENTS; OVERLAP REGION; QUANTUM TRANSPORT SIMULATIONS; REALISTIC DEVICES; SOURCE-TO-DRAIN TUNNELING; SUBTHRESHOLD SWING; ULTRA-SMALL;

EID: 77956192841     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3466908     Document Type: Article
Times cited : (86)

References (13)
  • 7
    • 0000489578 scopus 로고    scopus 로고
    • PLRBAQ 0556-2805. 10.1103/PhysRevB.56.R12748
    • B. A. Foreman, Phys. Rev. B PLRBAQ 0556-2805 56, R12748 (1997). 10.1103/PhysRevB.56.R12748
    • (1997) Phys. Rev. B , vol.56 , pp. 12748
    • Foreman, B.A.1
  • 8
    • 77956210762 scopus 로고    scopus 로고
    • note
    • G for many of the III-V semiconductors including InAs. Although the inclusion of finite size effects in bandstructure in our simulations, is thus qualitative, our assumption is that the said approximation will affect the lateral and vertical TFETs in a similar fashion and the observed trends will continue to highlight the underlying physics of each of them.
  • 13


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.