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Volumn 268, Issue 19, 2010, Pages 2897-2900
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Nano-structure formation due to impact of highly charged ions on HOPG
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Author keywords
AFM; Feature erasure; Friction; Hillocks; HOPG; Nanostructuring; STM
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
FRICTION;
KINETICS;
NANOSTRUCTURES;
SURFACE TREATMENT;
CONTINUOUS SCANNING;
FEATURE ERASURE;
HEIGHT MEASUREMENT;
HIGHLY CHARGED IONS;
HIGHLY ORDERED PYROLITIC GRAPHITES;
HILLOCKS;
HOPG;
NANO-STRUCTURING;
KINETIC ENERGY;
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EID: 77956177580
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2010.04.023 Document Type: Conference Paper |
Times cited : (21)
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References (31)
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