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Volumn 268, Issue 19, 2010, Pages 2897-2900

Nano-structure formation due to impact of highly charged ions on HOPG

Author keywords

AFM; Feature erasure; Friction; Hillocks; HOPG; Nanostructuring; STM

Indexed keywords

ATOMIC FORCE MICROSCOPY; FRICTION; KINETICS; NANOSTRUCTURES; SURFACE TREATMENT;

EID: 77956177580     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.04.023     Document Type: Conference Paper
Times cited : (21)

References (31)
  • 21
    • 68349127068 scopus 로고    scopus 로고
    • E. Sideras-Haddad et al., doi: 10.1016/j. nimb.2009.05.060
    • E. Sideras-Haddad et al., doi: 10.1016/j. nimb.2009.05.060.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.