SPM observation of nano-dots induced by slow highly charged ions

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 232, Issue 1-4, 2005, Pages 261-265

  Nakamura, Nobuyuki ^b   Terada, Masashi ^b   Nakai, Yoichi ^a   Kanai, Yasuyuki ^a   Ohtani, Shunsuke ^b   Komaki, Ken Ichiro ^c   Yamazaki, Yasunori ^a,c  

^a RIKEN   (Japan)

^b UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

Author keywords

Highly charged ions; Ion surface scattering; Scanning tunneling microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; IONS; IRRADIATION; KINETIC ENERGY; POTENTIAL ENERGY; SCANNING TUNNELING MICROSCOPY; SURFACE TREATMENT;

HIGHLY CHARGED IONS (HCI); ION-SURFACE SCATTERING; NANO-DOTS; SCANNING PROBE MICROSCOPE (SPM);

NANOSTRUCTURED MATERIALS;

EID: 19944374446     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.03.055     Document Type: Conference Paper

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