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Volumn 92, Issue , 2001, Pages 156-157
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STM studies of HCI-induced surface damage on highly oriented pyrolytic graphite
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL BONDS;
GRAPHITE;
SCANNING TUNNELING MICROSCOPY;
ULTRAHIGH VACUUM;
HIGHLY CHARGED IONS (HCI);
SURFACE PROPERTIES;
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EID: 0035715965
PISSN: 02811847
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (21)
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References (16)
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