A deceleration system at the Heidelberg EBIT providing very slow highly charged ions for surface nanostructuring

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 268, Issue 19, 2010, Pages 2972-2976

  Ginzel, R ^a   Higgins, S G ^a   Mrowcynski, P ^a   Northway, P ^a   Simon, M C ^a   Tawara, H ^a   Crespo Lopez Urrutia J R ^a   Ullrich, J ^a   Kowarik, G ^b   Ritter, R ^b   Meissl, W ^b   Vasko, C ^b   Gosselsberger C ^b   El Said, A S ^b   Aumayr, F ^b  

^a MAX PLANCK INSTITUT FÜR KERNPHYSIK   (Germany)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Electron beam ion trap; Highly charged ions; Ion surface interaction; Low energy ions; Surface nanostructuring

Indexed keywords

ELECTRON BEAM ION TRAPS; HIGHLY CHARGED IONS; ION-SURFACE INTERACTION; LOW ENERGY IONS; SURFACE NANOSTRUCTURING;

ELECTRON BEAMS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON OPTICS; KINETIC ENERGY; PARTICLE BEAM INJECTION;

IONS;

EID: 77956174815     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.05.020     Document Type: Conference Paper

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