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Thin Solid Films

Volumn 518, Issue 22, 2010, Pages 6537-6541

Characterization of sprayed CuInS2 films by XRD and Raman spectroscopy measurements

(2) Lee, Dong Yeup a Kim, Junho a

a SolarLight Ltd (South Korea)

Author keywords

CuInS2; Raman scattering; Sulfurization; Ultrasonic spray; XRD

Indexed keywords

CIS FILM; CRYSTALLINITIES; CUINS2; DEPOSITION METHODS; ELECTROSTATIC FIELD; SCANNING ELECTRON MICROSCOPE; SPECTROSCOPY MEASUREMENTS; SULFURIZATION; ULTRASONIC SPRAY; XRD;

COPPER COMPOUNDS; ELECTRON ENERGY LOSS SPECTROSCOPY; FILM GROWTH; GOLD; METALLIC FILMS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SCATTERING; ULTRASONICS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

COPPER;

EID: 77956058819 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2010.03.062 Document Type: Conference Paper

Times cited : (56)

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