Quasi real-time Raman studies on the growth of Cu-In-S thin films

Journal of Applied Physics

Volumn 95, Issue 9, 2004, Pages 5153-5158

  Rudigier, Eveline ^a   Barcones , Beatriz ^b   Luck, Ilka ^a   Jawhari Colin, T ^b   Pérez Rodríguez, Alejandro ^b   Scheer, Roland ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b UNIVERSITY OF BARCELONA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COPPER COMPOUNDS; FILM GROWTH; MAGNETRON SPUTTERING; PHONONS; RAMAN SPECTROSCOPY; SEMICONDUCTOR DOPING; STOICHIOMETRY; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

CHALCOPYRITES; SULFURIZATION; SURFACE SENSITIVITY; TEMPERATURE DEPENDENCE;

THIN FILMS;

EID: 2442602460     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1667009     Document Type: Article

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