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Volumn 480-481, Issue , 2005, Pages 362-366

In situ and ex situ characterisation of thermally induced crystallisation of CuInS2 thin films for solar cell

Author keywords

Auger electron spectroscopy; CuInS2; In situ Raman spectra

Indexed keywords

ANNEALING; AUGER ELECTRON SPECTROSCOPY; CRYSTALLIZATION; MICROSTRUCTURE; POLYCRYSTALLINE MATERIALS; RAMAN SCATTERING; SOLAR CELLS; SPUTTERING; THIN FILMS; X RAY DIFFRACTION;

EID: 18444400257     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.11.093     Document Type: Conference Paper
Times cited : (24)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.