Near-field optical data storage using C-apertures

Applied Physics Letters

Volumn 97, Issue 7, 2010, Pages

  Leen, J Brian ^a   Hansen, Paul ^a   Cheng, Yao Te ^a   Gibby, Aaron ^a   Hesselink, Lambertus ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; BIT SIZE; C-APERTURE; DATA BITS; DATA DENSITY; FOCUSED ION BEAM MILLING; NEAR-FIELD OPTICAL DATA STORAGE; NEAR-FIELD SCANNING OPTICAL MICROSCOPE; OPTICAL POWER; SUB-WAVELENGTH;

ATOMIC FORCE MICROSCOPY; GERMANIUM; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL DATA PROCESSING; OPTICAL RECORDING; TELLURIUM COMPOUNDS;

OPTICAL DATA STORAGE;

EID: 77956038242     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3474801     Document Type: Article

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