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Volumn 35, Issue 1 SUPPL. B, 1996, Pages 443-447
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Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode
a a a a a a b c
a
HITACHI LTD
(Japan)
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Author keywords
Nanometer recording; NSOM; Phase change recording; Scanning near field optical microscope; SNOM; Ultrahigh density recording
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Indexed keywords
LIGHT;
LIGHT PROPAGATION;
OPTICAL DATA STORAGE;
OPTICAL MICROSCOPY;
PHOTODETECTORS;
POLYCARBONATES;
READOUT SYSTEMS;
SEMICONDUCTING GERMANIUM COMPOUNDS;
SEMICONDUCTOR LASERS;
SILICA;
ZINC SULFIDE;
ILLUMINATING LIGHT POWER DEPENDENCE;
NANOMETER RECORDING;
PHASE CHANGE RECORDING;
SCANNING NEARFIELD OPTICAL MICROSCOPE;
SHEAR FORCE DETECTION;
ULTRAHIGH DENSITY RECORDING;
OPTICAL RECORDING;
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EID: 0029755287
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/JJAP.35.443 Document Type: Article |
Times cited : (99)
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References (9)
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