Writing 40 nm marks by using a beaked metallic plate near-field optical probe

Optics Letters

Volumn 31, Issue 2, 2006, Pages 259-261

  Matsumoto, T ^a   Anzai, Y ^a   Shintani, T ^a   Nakamura, K ^a   Nishida, T ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

NEAR-FIELD OPTICAL PROBE; OPTICAL SPOT; QUARTZ SLIDER; TRIANGULAR METALLIC PLATE;

FINITE ELEMENT METHOD; LIGHT SOURCES; MAGNETIC RECORDING; METALLIC COMPOUNDS; SCANNING ELECTRON MICROSCOPY;

NONLINEAR OPTICS;

EID: 33644518412     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.31.000259     Document Type: Article

References (15)

1. H. Saga, H. Nemoto, H. Sukeda, and M. Takahashi, Jpn. J. Appl. Phys., Part 1 38, 1839 (1999).
2. M. Ohtsu, ed., Near-field Nano/Atom Optics and Technology (Springer, 1998).
3. E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, and C.-H. Chang, Appl. Phys. Lett. 61, 142 (1992).
4. S. Hosaka, T. Shintani, M. Miyamoto, A. Kikukawa, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, and S. Krammer, J. Appl. Phys. 79, 8082 (1996).
5. T. Saiki, S. Mononobe, M. Ohtsu, N. Saito, and J. Kusano, Appl. Phys. Lett. 68, 2612 (1996).
6. T. Yatsui, M. Kourogi, and M. Ohtsu, Appl. Phys. Lett. 73, 2090 (1998).
7. T. Yatsui, M. Kourogi, K. Tsutsui, J. Takahashi, and M. Ohtsu, Opt. Lett. 25, 1279 (2000).
8. U. C. Fischer, Ultramicroscopy 42, 393 (1992).
9. J. Koglin, U. C. Fischer, and H. Fuchs, Phys. Rev. B 55, 7977 (1997).
10. X. Shi, L. Hesselink, and R. L. Thornton, Opt. Lett. 28, 1320 (2003).
11. T. Thio, K. M. Pellerin, R. A. Linke, H. J. Lezec, and T. W. Ebbesen, Opt. Lett. 26, 1972 (2001).
12. T. Matsumoto, T. Shimano, H. Saga, H. Sukeda, and M. Kiguchi, J. Appl. Phys. 95, 3901 (2004).
13. E. D. Palik, ed., Handbook of Optical Constants of Solids (Academic, 1985).
14. T. Shintani, Y. Anzai, H. Minemura, H. Miyamoto, and J. Ushiyama, Appl. Phys. Lett. 85, 639 (2004).
15. M. Terao, Y. Miyauchi, K. Andoo, H. Yasuoka, and R. Tamura, in Proc. SPIE 1078, 2 (1989).