Core level photoionization spectroscopy of supported metal clusters: Cu55 on silica

Journal of Electron Spectroscopy and Related Phenomena

Volumn 181, Issue 2-3, 2010, Pages 140-144

  Peters, S ^a   Peredkov, S ^a   Ferretti, N ^a   Savci, A ^a   Neeb, M ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

Auger spectroscopy; Cluster deposition; Copper cluster; Core photoelectron spectroscopy; X ray absorption

Indexed keywords

AUGER SPECTROSCOPY; AUGER SPECTRUM; BINDING ENERGY SHIFTS; CLUSTER DEPOSITION; COPPER CLUSTER; CORE LEVELS; CORE PHOTOELECTRON SPECTROSCOPY; CORE-LEVEL SPECTRA; FUNCTION OF TIME; NATURAL SILICA; PHOTOABSORPTION SPECTRA; PHOTOABSORPTIONS; PHOTOIONIZATION SPECTROSCOPY; SI WAFER; SUPPORTED METALS; X RAY IRRADIATION; XPS;

ABSORPTION; AUGER ELECTRON SPECTROSCOPY; AUGERS; BINDING ENERGY; ELECTRONS; IONS; PHOTOELECTRICITY; PHOTONS; RADIATION; SEMICONDUCTING SILICON COMPOUNDS; SILICA; SILICON WAFERS; X RAY ABSORPTION; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

ABSORPTION SPECTROSCOPY;

EID: 77955850751     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2010.01.004     Document Type: Conference Paper

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