Size dependence of the electronic structure of copper nanoclusters in SiC matrix

Chemical Physics Letters

Volumn 422, Issue 4-6, 2006, Pages 543-546

  Shin, Dong Woon ^a   Dong, Chungli ^b,c   Mattesini, M ^d   Augustsson, A ^b,d   Mao, S ^b   Chang, C L ^c   Persson, C ^e   Ahuja, R ^d   Nordgren, Joseph ^d   Wang, Shan X ^a   Guo, J H ^b  

^a Stanford University   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c TAMKANG UNIVERSITY   (Taiwan)

^d UPPSALA UNIVERSITY   (Sweden)

^e ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; BINDING ENERGY; COPPER; ELECTRON ENERGY LEVELS; ELECTRONIC STRUCTURE; SILICON CARBIDE; SIZE DETERMINATION; X RAY ANALYSIS;

HYBRIDIZATION; NANOCLUSTERS; SURFACE EFFECT; X-RAY ABSORPTION SPECTROSCOPY;

NANOSTRUCTURED MATERIALS;

EID: 33748165252     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2006.03.026     Document Type: Article

References (17)

1. Zimmerman R., Ila D., Williams E., Gasic B., Elsamadicy A., Evelyn A., Poker D., Hensley D., and Larkin D. Nucl. Instr. Meth. B 166-167 (2000) 892
2. Fukuzawa H., Yuasa H., Hashimoto S., Koi K., Iwasaki H., Takagishi M., Tanaka Y., and Sahashi M. IEEE Trans. Magn. 40 (2004) 2236
3. Hansen P.L., Wagner J.B., Helveg S., Rostrup-Nielsen J.R., Clausen B.S., and Topsoe H. Science 295 (2002) 2053
4. Nishimori K., Tokutaka H., Nakanishi S., Kishida S., and Ishihara N. Jpn. J. Appl. Phys. Lett. 28 (1989) L1345
5. An Z., Ohi A., Hirai M., Kusaka M., and Iwami M. Surf. Sci. 493 (2001) 182
6. An Z., Hirai M., Kusaka M., Saitoh T., and Iwami M. Jpn. J. Appl. Phys. Part 1 40/3B (2001) 1927
7. Dontas I., Ladas S., and Kennou S. Diamond Relat. Mat. 12 (2003) 1209
8. Shin D.W., Wang S.X., Marshall A., Kimura W., Dong C.L., Augustsson A., and Guo J. Thin Solid Films 473 (2005) 267
9. Warwick T., Heimann P., Mossessian D., McKinney W., and Padmore H. Rev. Sci. Instrum. 66 (1995) 2037
10. Zhang P., and Sham T.K. Phys. Rev. Lett. 90 (2003) 245502
11. Hsieh H.H., Chang Y.K., Pong W.F., Pieh J.Y., Tseng P.K., Sham T.K., Coulthad I., Naftel S.J., Lee J.F., Chung S.C., and Tsang K.L. Phys. Rev. B 57 (1998) 15204
12. Coulthard I., Degen I.S., Zhu Y., and Sham T.K. Can. J. Chem. 76 (1998) 1707
13. Benfield R., Grandjean D., Kroll M., Pugin R., Sawitowski T., and Schmid G. J. Phys. Chem. B. 105 (2001) 1961
14. Ankudinov A.L., Ravel B., Rehr J.J., and Conradson S.D. Phys. Rev. B 58 (1988) 7565
15. Ankudinov A.L., Bouldin C., Rehr J.J., Sims J., and Hung H. Phys. Rev. B 65 (2002) 104107
16. Rehr J.J., and Albers R.C. Rev. Mod. Phys. 72 (2000) 621
17. Zabinsky S.I., Rehr J.J., Ankudinov A., Albers R.C., and Eller M.J. Phys. Rev. B 52 (1995) 2995